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1

Prognostics of IGBT modules based on the approach of particle filtering

Lu, Yizhou, Christou, Aris

Journal:

Microelectronics Reliability

Year:

2019

Language:

english

File:

PDF, 1.77 MB

english, 2019

2

Stress relaxation behavior and low cycle fatigue behavior of bulk SAC 305

Gary Paradee,Eric Bailey,Aris Christou

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2014

Language:

english

File:

PDF, 1.48 MB

english, 2014

3

Fatigue Properties of ITO and Graphene on Flexible Substrates

Paradee, Gary, Martin, Tom, Christou, Aris

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.24 MB

english, 2015

4

Failure mechanisms of GaAs mesfets with Cu/refractory metallized gates

Ting Feng, A. Dimoulas, Aris Christou, G. Constantinidis, Z. Hatzopoulos

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 258 KB

english, 1997

5

The effect of corrosion on the performance of high speed multi-chip module interconnects

Lee Guan, Aris Christou, David F. Barbe

Journal:

Quality and Reliability Engineering International

Year:

2000

Language:

english

File:

PDF, 132 KB

english, 2000

6

Diffusion controlled degradation analysis of high temperature (Bi,Sb)2(Te,Se)3 semiconductor thermoelectric power modules

Choupin Huang, Aris Christou

Journal:

Materials Science and Engineering: B

Year:

1995

Language:

english

File:

PDF, 327 KB

english, 1995

7

4-(Hydroxymethyl)pyridine and pyrimidine in manganese benzoate chemistry: Preparation and characterization of hexanuclear clusters featuring the core

Theocharis C. Stamatatos, Dolos Foguet-Albiol, Spyros P. Perlepes, Catherine P. Raptopoulou, Aris Terzis, Costas S. Patrickios, George Christou, Anastasios J. Tasiopoulos

Journal:

Year:

2006

Language:

english

File:

PDF, 387 KB

english, 2006

8

New Mn3 structural motifs in manganese single-molecule magnetism from the use of 2-pyridyloximate ligands

Theocharis C. Stamatatos, Dolos Foguet-Albiol, Constantinos C. Stoumpos, Catherine P. Raptopoulou, Aris Terzis, Wolfgang Wernsdorfer, Spyros P. Perlepes, George Christou

Journal:

Year:

2007

Language:

english

File:

PDF, 424 KB

english, 2007

9

Charge transport in low-dimensional nitride semiconductor heterostructures

Journal:

Physica B: Condensed Matter

Year:

2001

Language:

english

File:

PDF, 174 KB

english, 2001

10

Epitaxial issues and growth morphologies of InAlAs/InGaAs heterostructures on non-(100) InP index substrates

Aris Christou, Athanasios Dimoulas, A Cornet

Journal:

Materials Science and Engineering: B

Year:

2001

Language:

english

File:

PDF, 353 KB

english, 2001

11

Monte Carlo reliability model for microwave monolithic integrated circuits

Journal:

Quality and Reliability Engineering International

Year:

2008

Language:

english

File:

PDF, 205 KB

english, 2008

12

Initial Example of a Triangular Single-Molecule Magnet from Ligand-Induced Structural Distortion of a [Mn III3 O] 7+ Complex

Stamatatos, Theocharis C., Foguet-Albiol, Dolos, Stoumpos, Constantinos C., Raptopoulou, Catherine P., Terzis, Aris, Wernsdorfer, Wolfang, Perlepes, Spyros P., Christou, George

Journal:

Journal of the American Chemical Society

Year:

2005

Language:

english

File:

PDF, 96 KB

english, 2005

13

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Life-stress relationship for thin film transistor gate line interconnects on flexible substrates

Martin, Thomas, Christou, Aris

Year:

2009

Language:

english

File:

PDF, 263 KB

english, 2009

14

[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - A physics of failure based qualification process for flexible display interconnect materials

Martin, Thomas, Christou, Aris

Year:

2011

Language:

english

File:

PDF, 267 KB

english, 2011

15

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Line-spike induced failure mechanism in integrated circuit bond-wires

Seokjin Kim,, Kwangsik Choi,, Peckerar, Martin, Christou, Aris

Year:

2008

Language:

english

File:

PDF, 396 KB

english, 2008

16

[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - Stress relaxation behavior and low cycle fatigue behavior of bulk SAC 305

Paradee, Gary, Christou, Aris

Year:

2011

Language:

english

File:

PDF, 1.07 MB

english, 2011

17

Ultraviolet detector based on graphene/SiC heterojunction

Anderson, Travis J., Hobart, Karl D., Greenlee, Jordan D., Shahin, David I., Koehler, Andrew D., Tadjer, Marko J., Imhoff, Eugene A., Myers-Ward, Rachael L., Christou, Aris, Kub, Francis J.

Journal:

Applied Physics Express

Year:

2015

Language:

english

File:

PDF, 774 KB

english, 2015

18

Gold/Niobium Thin Film Metallizations for GaAs Devices and Circuits

Esser, Robert, Christou, Aris

Journal:

MRS Proceedings

Year:

2001

Language:

english

File:

PDF, 352 KB

english, 2001

19

Die Attach Adhesion and Void Formation at the Gaas Substrate Interface

Strifas, Nickolaos, Christou, Aris

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 371 KB

english, 1994

20

Tungsten Silicide Stability and Interface Reaction Determined by Modeling and Experiments

Feng, Ting, Christou, Aris

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 371 KB

english, 1994

21

Diamond Heat Sinks For High Temperature Electronics: Simuilation, And Thermal Analysis

Strifas, Nickolaos, Christou, Aris

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 304 KB

english, 1995

22

Simulation Of Thermal Stresses, Voids And Fracture At The GaAs/Ceramic Interface

Strifas, Nickolaos, Christou, Aris

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 365 KB

english, 1995

23

Diffusion Barrier Reliability with Respect to the Role of Tin Stoichiometry Between Al Metallization and Si Substrate

Tseng, Han-Yu, Christou, Aris, Young, Dan, Tessner, Ted, Orloff, Jon

Journal:

MRS Proceedings

Year:

1996

Language:

english

File:

PDF, 235 KB

english, 1996

24

Interfacial Delamination in Plastic Encapsulated Integrated Circuits (Pics)

Strifas, Nickolaos, Christou, Aris

Journal:

MRS Proceedings

Year:

1996

Language:

english

File:

PDF, 2.91 MB

english, 1996

25

Mechanical Deformation Modeling of Diamond/Gaas Structures

Strifas, Nickolaos, Christou, Aris

Journal:

MRS Proceedings

Year:

1996

Language:

english

File:

PDF, 1.44 MB

english, 1996

26

TiNi/GaAs Thin Film Structures for Gate Metallizations

Zhang, Chichang, Christou, Aris

Journal:

MRS Proceedings

Year:

2000

Language:

english

File:

PDF, 128 KB

english, 2000

27

Ti/Ni/Au/Diamond MIS Field Effect Transistors With TiO2 Gate Dielectric

Cai, Yuhong, Christou, Aris

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 121 KB

english, 2002

28

Design and Fabrication of a VCSEL With Graded Bragg Mirror Interfaces for Operation at 850nm

Zhang, Chichang, Christou, Aris

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 112 KB

english, 2002

29

Design of a 364 nm Electrically Pumped Multi-Quantum Well Continuous Wave Nitride Vertical Cavity Surface Emitting Laser

Luke, Shelia C., Motayed, Abhishek, Christou, Aris

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 112 KB

english, 2002

30

High Gain, Low Threshold Current GaInAsP Based Vcsels for Operation at 1.24UM

Tan, Zhuopeng, Li, Yixin, Christou, Aris

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 165 KB

english, 2002

31

Electrical and Thermal Stability of ALD-Deposited TiN Transition Metal Nitride Schottky Gates for AlGaN/GaN HEMTs

Shahin, David I., Anderson, Travis J., Wheeler, Virginia D., Tadjer, Marko J., Koehler, Andrew D., Hobart, Karl D., Eddy, Charles R., Kub, Francis J., Christou, Aris

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 979 KB

english, 2016

32

SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Optoelectronic Interconnects and Component Integration IX - Life-stress relationship for thin film transistor gate line interconnects on flexible substrates

Martin, Thomas, Glebov, Alexei L., Chen, Ray T., Christou, Aris

Year:

2010

Language:

english

File:

PDF, 1.05 MB

english, 2010

33

Enhancement mode AlGaN/GaN MOS high-electron-mobility transistors with ZrO 2 gate dielectric deposited by atomic layer deposition

Anderson, Travis J., Wheeler, Virginia D., Shahin, David I., Tadjer, Marko J., Koehler, Andrew D., Hobart, Karl D., Christou, Aris, Kub, Francis J., Eddy, Charles R.

Journal:

Applied Physics Express

Year:

2016

Language:

english

File:

PDF, 741 KB

english, 2016

34

Lifetime Estimation of Insulated Gate Bipolar Transistor Modules Using Two-step Bayesian Estimation

Lu, Yizhou, Christou, Aris

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 987 KB

english, 2017

35

ALD TiN Schottky Gates for Improved Electrical and Thermal Stability in III-N Devices

Wheeler, Virginia D., Anderson, Travis J, Ahn, Shihyun, Shahin, David I, Tadjer, Marko J, Koehler, Andrew D., Hobart, Karl D, Ren, Fan, Kub, Francis J, Christou, Aris, Eddy, Charles R.

Journal:

ECS Transactions

Year:

2017

Language:

english

File:

PDF, 499 KB

english, 2017

36

Electrical characterization of ALD HfO 2 high-k dielectrics on ( 2¯01) β-Ga 2 O 3

Shahin, David I., Tadjer, Marko J., Wheeler, Virginia D., Koehler, Andrew D., Anderson, Travis J., Eddy, Charles R., Christou, Aris

Journal:

Applied Physics Letters

Year:

2018

Language:

english

File:

PDF, 914 KB

english, 2018

37

Radiation Effects in Diamond pHEMTs

Thapa, Aayush, Shahin, David, Christou, Aris

Journal:

ECS Transactions

Year:

2019

File:

PDF, 323 KB

2019